A combination of depth-sensing indentation and Raman microspectroscopy has been used for the identification of pressure-induced phase transformations in silicon, germanium, boron carbide and partially stabilized zirconia single crystals. Phase transformations during nanoindentation may be revealed through deviations in the shape of the load-displacement curves from that of a perfect elastoplastic material. Such deviations are often more readily identified if the nanoindentation data are presented as average contact pressure vs. contact depth curves, allowing assessment of the corresponding transformation pressures.